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Goodness of fit tests in stochastic frontier models
Authors:Wei Siang Wang  Christine Amsler  Peter Schmidt
Institution:(1) Nanyang Technological University, Singapore, Singapore;(2) Michigan State University, East Lansing, MI, USA;(3) Yonsei University, Seoul, South Korea;
Abstract:In this paper we discuss goodness of fit tests for the distribution of technical inefficiency in stochastic frontier models. If we maintain the hypothesis that the assumed normal distribution for statistical noise is correct, the assumed distribution for technical inefficiency is testable. We show that a goodness of fit test can be based on the distribution of estimated technical efficiency, or equivalently on the distribution of the composed error term. We consider both the Pearson χ 2 test and the Kolmogorov–Smirnov test. We provide simulation results to show the extent to which the tests are reliable in finite samples.
Keywords:
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