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Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies |
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| Authors: | Briec Walter Kerstens Kristiaan Leleu Hervé Eeckaut Philippe Vanden |
| Affiliation: | (1) CREREG & JEREM, Université de Perpignam, 54 Avenue Villeneuve, F-66000 Perpignan, France;(2) LABORES, Université Catholique de Lille, 60 Boulevard Vauban, B.P. 109, F-59016 Lille Cédex, France;(3) Institut de Statistique, Université Catholique de Louvain, Voie du Roman Pays 20, B-1348 Louvain-la-Neuve, Belgium |
| Abstract: | Thepurpose of this short article is to simplify goodness-of-fitmethods to obtain qualitative information about returns to scalefor individual observations. Traditional and new goodness-of-fitmethods developed for estimating returns to scale on nonparametricdeterministic reference technologies are reviewed. Using compositionrules for technologies with specific returns to scale assumptions,we show how these goodness-of-fit methods can be simplified inthe case of convex technologies (Data Envelopment Analysis (DEA)models). |
| Keywords: | Returns to scale DEA FDH |
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