首页 | 本学科首页   官方微博 | 高级检索  
     


Testing the Gaussian and Student's t copulas in a risk management framework
Affiliation:1. University of Bordeaux, Department of Economics, France;2. KEDGE Business School and University of Bordeaux (IRGO, EA4190), 680 cours de la Libération, 33405 Talence, France;1. Imperial College Business School, UK;2. Innopolis University, Russia;3. The University of Sydney Business School, Australia;4. St.Petersburg State University, Russia;1. Istanbul Medeniyet University, Turkey;2. Rajagiri Business School, Rajagiri Valley Campus, Kochi, India;3. Tunis Business School, Université de Tunis, Tunisia;4. School of Management and Economics, Beijing Institute of Technology, Beijing, China;5. COMSATS, China University Islamabad, Lahore Campus, Pakistan;6. Center for Energy and Environmental Policy Research, Beijing Institute of Technology, Beijing, China
Abstract:
This paper introduces a semiparametric framework for selecting either a Gaussian or a Student's t copula in a d-dimensional setting. We compare the two models using four different approaches: (i) four goodness-of-fit graphical plots, (ii) a bootstrapped correlation matrix generated in each scenario with the empirical correlation matrix used as a benchmark, (iii) Value-at-Risk (VaR) and Expected Shortfall (ES) as risk measures, and (iv) co-Value-at-Risk (CoVaR) and Marginal Expected Shortfall (MES) as co-risk measures. We illustrate this four-step procedure using a portfolio of daily returns of six international stock indices. The VaR results confirm that the t-based copula model is an attractive alternative to the Gaussian. The ES analysis is less conclusive, and indicates that risk managers should jointly use the risk measure as well as the copula model. The results highlight the importance of promoting stress testing rather than ES in the risk management industry, particularly in the aftermath of a financial crisis.
Keywords:Risk management  Elliptic copulas  Goodness-of fit tools  Value-at-Risk  Expected Shortfall  Co-risk measures
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号