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An improved empirical Bayes test for positive exponential families
Authors:Tachen Liang
Institution:Wayne State University Detroit, USA
Abstract:We exhibit an empirical Bayes test δ* n for a decision problem using a linear error loss in a class of positive exponential families. This empirical Bayes test δ* n possesses the asymptotic optimality, and its associated regret converges to zero with rate n ?1(ln n )6 This rate of convergence improves the previous results in the literature in the sense that a faster rate of convergence is achieved under much weaker conditions. Examples are presented to illustrate the performance of the empirical Bayes test δ* n
Keywords:asymptotically optimal rate of convergence  regret
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