An improved empirical Bayes test for positive exponential families |
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Authors: | Tachen Liang |
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Affiliation: | Wayne State University Detroit, USA |
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Abstract: | We exhibit an empirical Bayes test δ* n for a decision problem using a linear error loss in a class of positive exponential families. This empirical Bayes test δ* n possesses the asymptotic optimality, and its associated regret converges to zero with rate n −1(ln n )6 This rate of convergence improves the previous results in the literature in the sense that a faster rate of convergence is achieved under much weaker conditions. Examples are presented to illustrate the performance of the empirical Bayes test δ* n |
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Keywords: | asymptotically optimal rate of convergence regret |
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