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Some Cracks in the Empire of Chance (Flaws in the Foundations of Reliability)
Authors:Nozer D Singpurwalla
Institution:The George Washington University, Washington, DC 20052, USA
Abstract:Making quantified statements about the uncertainty associated with the lifelength of an item is one of the most fundamental tasks of reliability assessment. Most practitioners routinely do this using one of the several available statistical techniques. The purpose of this paper is two-fold. The first is to give the user an overview of the key tenets of two of the most commonly used parametric approaches. The second is to point out that these commonly used approaches involve strategies that are either ad hoc, or are in violation of some of the underlying tenets. A method that is devoid of logical flaws can be proposed, but this method is difficult to implement. The user must therefore resign to using that technique against which the fewest objections can be hurled.
Keywords:Relative Frequency  Subjective Probability  Parameters  Probability Models  Likelihood Principle  Maximum Likelihood  Bayes Law
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