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多层微波集成电路中微带线层间互连仿真
引用本文:姬五胜,姬晓春,孙发坤,刘 颖.多层微波集成电路中微带线层间互连仿真[J].国际商务研究,2017,57(11).
作者姓名:姬五胜  姬晓春  孙发坤  刘 颖
作者单位:天津职业技术师范大学 天线与微波技术研究所,天津300222,天津职业技术师范大学 天线与微波技术研究所,天津300222,天津职业技术师范大学 天线与微波技术研究所,天津300222,天津职业技术师范大学 天线与微波技术研究所,天津300222
基金项目:天津职业技术师范大学2014年校级预研项目(KJY14-05)
摘    要:针对多层微波集成电路设计的微带线层间互连问题,介绍了垂直通孔互连、垂直带条互连和层耦合过渡互连三种高性能的互连方法,并且采用三维电磁仿真软件HFSS对这三种互连结构进行了建模和仿真。仿真结果表明,垂直通孔互连和垂直带条互连在0.1~25 GHz的频宽范围内,回波损耗S11<-20 dB,插入损耗S21>-1 dB,互连性能优良,而层耦合过渡互连在20~68 GHz内回波损耗S11 <-20 dB,插入损耗S21>-1 dB,具有在毫米波频段实现互连的潜力。

关 键 词:多层微波集成电路  垂直通孔互连  垂直带条互连  层耦合过渡  S参数

Simulation of interconnection between microstrip lines in multilayer microwave integrated circuit
JI Wusheng,JI Xiaochun,SUN Fakun and LIU Ying.Simulation of interconnection between microstrip lines in multilayer microwave integrated circuit[J].International Business Research,2017,57(11).
Authors:JI Wusheng  JI Xiaochun  SUN Fakun and LIU Ying
Abstract:Three microstrip interconnection circuit structures of vertical via interconnection,vertical strip interconnection, and coupling transition between the layers are introduced and simulated for solving the problem of interconnection between microstrip lines in multilayer microwave intergration circuits(MuMICs). The simulation is done by using the 3D electromagnetic simulation software HFSS. The simulated result shows that the return loss (S11) and insertion loss (S21) of the vertical via interconnection and the vertical strip interconnection are <-20 dB and >-1 dB in 0.1~25 GHz,repectively, showing good connection performance. At the same time, the return loss (S11) and insertion loss (S21) of the coupling transition between the layers are <-20 dB and >-1 dB in 20~68 GHz,respectively,which shows this method has the potential to be used in millimeter wave bands.
Keywords:multilayer microwave integrated circuit (MuMIC)  vertical via interconnection  vertical strip interconnection  coupling transition between the layers  S parameter
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