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低频频率特性测试仪的设计与实现
引用本文:马知远,范越,刘豪.低频频率特性测试仪的设计与实现[J].黄石理工学院学报,2011(4):10-14.
作者姓名:马知远  范越  刘豪
作者单位:海军工程大学电子工程学院;烽火通信科技股份有限公司;
摘    要:针对目前低频段的频率特性测试仪种类较少、功能单一、体积庞大、价格昂贵等问题,从硬件设计入手,通过对扫频信号输出性能指标的分析,提出了DDS信号源以及电流型反馈运算放大电路的设计方法。输入、输出衰减网络采用了Ⅱ型阻抗匹配网络,通过继电器可方便地进行控制。增加了相位测量功能,提出了采用2片幅度相位检测芯片AD8302来测量相位差以及判别相位极性的方法。使用ARM9处理器$3C2440作为控制电路的核心,将其嵌入式系统解决方案引入到测试仪中,简化了电路结构。

关 键 词:低频  频率特性  信号源  放大电路  相位差

Design and Realization of Tester for Low Frequency Response Characteristics
MA Zhiyuan FAN Yue LIU Hao.Design and Realization of Tester for Low Frequency Response Characteristics[J].Journal of Huangshi Institute of Technology,2011(4):10-14.
Authors:MA Zhiyuan FAN Yue LIU Hao
Institution:MA Zhiyuan1 FAN Yue1 LIU Hao2(1 School of Electronic Engineering,Naval University of Engineering,Wuhan Hubei 430033,2 FiberHome Telecommunication Technologies Co.,Ltd,Wuhan Hubei 430074)
Abstract:To solve the problems in domestic low frequency response characteristics,such as few variety,simple function,high price,bulkiness and complex circuit structure,a method of DDS signal source and amplifier were introduced.Pi shape impedance matching network was designed in the output and input attenuation network.A new method of phase difference and phase polarity test was introduced by using two AD8302.The embedded system solutions based on ARM9 S3C2440 had predigested the circuit structure.
Keywords:low frequency  frequency characteristics  signal source  amplifier  phase difference  
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