首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Using DEA and Worst Practice DEA in Credit Risk Evaluation
Authors:Paradi  Joseph C  Asmild  Mette  Simak  Paul C
Institution:(1) Department of Chemical Engineering and Applied Chemistry, CMTE, University of Toronto, 200 College Street, Toronto, Ontario, M5S 3E5, Canada;(2) CMTE, University of Toronto, Canada;(3) McKinsey & Company, Canada
Abstract:The purpose of this paper is to introduce the concept of worst practice DEA, which aims at identifying worst performers by placing them on the frontier. This is particularly relevant for our application to credit risk evaluation, but this also has general relevance since the worst performers are where the largest improvement potential can be found. The paper also proposes to use a layering technique instead of the traditional cut-off point approach, since this enables incorporation of risk attitudes and risk-based pricing. Finally, it is shown how the use of a combination of normal and worst practice DEA models enable detection of self-identifiers. The results of the empirical application on credit risk evaluation validate the method. The best combination of layered normal and worst practice DEA models yields an impressive 100% bankruptcy and 78% non-bankruptcy prediction accuracy in the calibration data set, and equally convincing 100% and 67% out-of-sample classification accuracies.
Keywords:data envelopment analysis  credit risk  worst practice DEA  layering or peeling technique
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号