| 某种电子装备步进应力加速寿命试验研究 |
| |
| 引用本文： | 郑波,陈绵云. 某种电子装备步进应力加速寿命试验研究[J]. 河北工业科技, 2001, 18(6): 1-3,23 |
| |
| 作者姓名： | 郑波 陈绵云 |
| |
| 作者单位： | 华中科技大学控制科学与工程学系,湖北武汉,430074 |
| |
| 基金项目： | 国防科技预研基金项目(00J15.3.3.JW0528) |
| |
| 摘 要： | 简述了进行某种电子装备步进应力加速寿命试验的试验应力、应力水平、试验项目和试验结果 ,分析探讨了试验应力、应力水平的确定原则和步进应力加速寿命试验数据统计分析方法 ,给出了某种电子装备在正常应力水平下的贮存寿命。
|
| 关 键 词： | 电子装备 电子组件 步进应力 加速寿命试验 |
| 文章编号： | 1008-1534(2001)06-0001-03 |
The Study on the Stepping Stress Accelerated Life Span Test of a Military Electronic Equipment |
| |
| ZHENG Bo,CHEN Mian yun. The Study on the Stepping Stress Accelerated Life Span Test of a Military Electronic Equipment[J]. Hebei Journal of Industrial Science & Technology, 2001, 18(6): 1-3,23 |
| |
| Authors: | ZHENG Bo CHEN Mian yun |
| |
| Abstract: | In this paper,the stepping stress accelerated life test of an electronic equipment is introduced,the test subject,test results,test stress and the level of stress is described,and the determination principles of the test stress,the level of stress and the method of statistical analysis of stepping stress accelerated life test data are explored.Then the storage life span of the electronic equipment under the normal stress level is given. |
| |
| Keywords: | electronic equipment electronic assembly stepping stress accelerated life span test |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
