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Notes on Sensitivity and Stability of the Classifications of Returns to Scale in Data Envelopment Analysis: A Comment

Authors:	Lawrence?M?Seiford Email author" target="_blank">Joe?Zhu Email author

Institution:	(1) Department of Industrial and Operations Engineering, University of Michigan, Ann Arbor, MI 48109-2117, USA;(2) Department of Management, Worcester Polytechnic Institute, Worcester, MA 01609, USA

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