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如何减少变电站保护测控装置二次缺陷
引用本文:贾廷波,彭志宏.如何减少变电站保护测控装置二次缺陷[J].价值工程,2011,30(18):48-49.
作者姓名:贾廷波  彭志宏
作者单位:1. 日照供电公司,日照,276826
2. 日照市水产技工学校,日照,276826
摘    要:微机保护测控装置二次缺陷常常造成严重危害,必需重点解决此类问题。文章分析了造成此缺陷的因素,并针对具体的缺陷进行理论分析然后提出了解决措施。

关 键 词:保护测控装置  二次缺陷  因素  措施

How to Reduce Secondary Defects of Substation Protection and Monitoring Device
Jia Tingbo,Peng Zhihong.How to Reduce Secondary Defects of Substation Protection and Monitoring Device[J].Value Engineering,2011,30(18):48-49.
Authors:Jia Tingbo  Peng Zhihong
Institution:① Jia Tingbo;② Peng Zhihong(①Rizhao Power Supply Company,Rizhao 276826,China;②Rizhao Fisheries Technical School,Rizhao 276826,China)
Abstract:The secondary defects of computer protection and monitoring device often cause serious harm, so we must focus on resolving these issues. This paper analyzes the factors that caused the defect, and makes theoretical analysis for the specific defects and proposes solutions.
Keywords:protection and control device  secondary defects  factors  solutions
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