首页 | 本学科首页   官方微博 | 高级检索  
     


The Relationship of the Degree of Exposure to a Technological Disaster and Emotional Response: A Structural Model Approach
Authors:Esparcia  Adolfo Jarne  Guárdia Olmos  Joan
Affiliation:(1) Departament de Personalitat, Avaluació i Tractaments Psicológics, Universitat de Barcelona, España;(2) Departament de Metodologia de les Ciéncies del Comportament, Universitat de Barcelona, España
Abstract:The aim of this study was to analyze type and intensity of psychopathological response (depression and post-traumatic stress disorder) in a population sample from Guadalajara, Mexico, in an area affected by a series of gas explosions in 1992. The study comprised a series of interviews conducted three months after the event. Three groups were formed: subjects directly exposed to the explosions; those affected by the explosions but not directly exposed to them; and a control group. We devised a model, defining that the depressive level is affected by the socioeconomic level and the attributional style; being affected by the exposition degree to the disaster. This question was evaluated as using the structural models technique. The results indicate a close relationship between the variables defined and confirm the action of degree of exposure to the disaster. In fact, a reasonable fit for the model was only obtained in the direct exposure group; the fit was poor in the other two groups, in which results were largely similar. We conclude that the intensity of exposure to the event has a fundamental bearing on victims' psychopathological response, and on the development of posttraumatic stress disorder.
Keywords:Post-traumatic stress disorder  technological disaster  depression  structural models
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号