On estimating the reliability after sequentially estimating the mean: The exponential case |
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Authors: | Nitis Mukhopadhyay A. R. Padmanabhan T. K. S. Solanky |
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Affiliation: | (1) Department of Statistics, University of Connecticut, 02629 Storrs, CT, USA;(2) Department of Mathematics, Monash University, 3168 Clayton, Victoria, Australia;(3) Department of Mathematics, University of New Orleans, 70148 New Orleans, LA, USA |
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Abstract: | Sequential estimation problems for the mean parameter of an exponential distribution has received much attention over the years. Purely sequential and accelerated sequential estimators and their asymptotic second-order characteristics have been laid out in the existing literature, both for minimum risk point as well as bounded length confidence interval estimation of the mean parameter. Having obtained a data set from such sequentially designed experiments, the paper investigates estimation problems for the associatedreliability function. Second-order approximations are provided for the bias and mean squared error of the proposed estimator of the reliability function, first under a general setup. An ad hoc bias-corrected version is also introduced. Then, the proposed estimator is investigated further under some specific sequential sampling strategies, already available in the literature. In the end, simulation results are presented for comparing the proposed estimators of the reliability function for moderate sample sizes and various sequential sampling strategies. |
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Keywords: | Exponential distribution reliability function estimation bias correction mean square error sequential sampling |
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