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Toward effective international technology assessments |
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| Authors: | Kan Chen Professor Lech Zacher Professor |
| Institution: | 1. Department of Electrical and Computer Engineering at the University of Michigan, Ann Arbor, Michigan, USA;2. Polish Academy of Sciences, Institute of Philosophy and Sociology and in the Academy''s Research and Prognostic Committee “Poland 2000”, Warsaw, Poland |
| Abstract: | A cross-national understanding of technology policy decision processes and basic premises underlying technology assessment must be established before an effective technology assessment methodology can be developed to conduct substantive technology assessments on an international scale. |
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