节省半导体测试时间成本的新方法——并发测试

半导体测试时间直接影响到整个半导体测试的成本,文章提出了一种缩短半导体测试时间的新方法——并发测试。并发测试技术可以在保证测试覆盖率的前提下显著地缩减测试时间,提高半导体测试设备硬件资源的利用率。文章分析了实现并发测试需要的先决条件,阐述了应用并发测试方法的实现流程,并给出了应用并发测试方法节省测试时间的实例。

Concurrent Test-a New Way of Time-cost-saving Test on Semiconductor

The time spent in testing on semiconductor directly influences the costs of the whole semiconductor test.The paper suggests a new way to shorten the time to test on semiconductor.The method can obviously shorten the test time on the condition of the assurance of test overage and improve the utilization of hardware resources for semiconductor test.Furthermore, the paper analyzes the prerequisite for realizing the concurrent test,illustrates the whole process of such test with the new method and gives the readers an example of the test.