首页 | 本学科首页   官方微博 | 高级检索  
     


A generalization of Friedman's rank statistic
Authors:J. de  Kroon P. van der  Laan
Affiliation:*Nederlandse Philips Bedrijven B.V., Centre for Quantitative Methods, Eindhoven, The Netherlands;**Agricultural University, Vakgroep Wiskunde, Wageningen, The Netherlands.
Abstract:Abstract  In this paper a very natural generalization of the two-way analysis of variance rank statistic of F riedman is given. The general distribution-free test procedure based on this statistic for the effect of J treatments in a random block design can be applied in general two-way layouts without interactions and with different numbers of the continuous observations per cell provided the design scheme is connected. The asymptotic distribution under the null hypothesis of the test statistic is derived. A comparison with the method of m rankings of B enard and van E lteren is made. The disadvantage of B enard and van E lteren's test procedure is that the number of observations per block does influence the statistic twice, namely firstly by the number itself, as it should, and see ondly by the level of the ranks which will be different in different blocks if the numbers of observations per block are different. The proposed test statistic is not sensitive to differences in the levels of the ranks caused by the different numbers of observations per block. The test is derived from considerhg the K ruskal -W allis statistics per block.
Finally, the results of simulation experiments are given. The simulation is carried out for three designs and a number of normal location alternatives and gives some information about the power of the suggested test procedure. A comparison is made with B enard and van E lteren's test and with the classical analysis of variance technique. For some simple orthogonal designs the exact null distributions of B enard and van E lteren's test and the proposed test are compared.
Keywords:Friedman's rank test    distribution-free analysis of variance    generalized Friedman's rank test    rank test for an inorthogonal design
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号