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Reading between the ratings: Modeling residual credit risk and yield overlap
Institution:1. Shanghai Advanced Institute of Finance and Shanghai Jiao Tong University, China;2. Graduate Institute of Statistics, National Central University, Taiwan;3. Institute of Statistics, National Chiao Tung University, Taiwan;1. Northeastern University, Boston, MA02186, USA;2. University of California,Riverside, CA92508, USA;3. Securities and Exchange Commission, 44 Montgomery Street, San Francisco, CA94104, USA
Abstract:Credit ratings group firms by risk, yet yields are shown to overlap between firms of adjacent ratings. We model this by considering the residual risk arising from differences in the parameters of each firm's value process for firms with the same rating. To do so, our framework simultaneously incorporates jump default with Markov-governed likelihoods and continuous defaults in a default-barrier framework. We provide closed-form approximations for expected default time and tail probabilities, and empirically fit the S-shaped yield curve, intra-rating spread, and inter-rating overlap. Results are robust to time period, rating system, sub-rating, and common characteristics such as liquidity.
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