Kosten-optimale Prüfpläne für die Gut-Schlecht-Prüfung |
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Authors: | Prof. Dr. Werner Uhlmann |
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Affiliation: | 1. Institut für Statistik der Universit?t Würzburg, Germany
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Abstract: | Summary A lot is accepted if the number of defective units in a sample of sizen does not exceed the acceptance numberc. The usefulness of the sampling plan (n, c) is described by the regret function. This regret functionR(p), depending on the proportionp of defective units in the lot, is the expectation of the avoidable costs. There always exists an optimum sampling plan which minimizes the maximum ofR(p). The dependence of the maxima ofR(p) onn andc is studied and some theorems are given which are useful for calculating the minimax solution, that is the optimum sampling plan. |
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